Systematic Variation Effect
ChronoVA™/LVA
The statistic data is generated within ChronoVA™/LC process by invoking
SPICE simulation. In this process, systematic variation impact such as
layout dependency of mobility enhanced by the stress from shallow trench
can be added using ChronoVA™/LVA. Mobility enhancement against the
layout topology is described in the rule file and taken into the SPICE
parameters during the characterization. Other systematic variation effect
can be also modeled in the rule file. Effectiveness of this approach is
proven in Fujitsu 65nm library, that was reported in the article on the
Nikkei Microdevice magazine.
ChronoVA™/LVA can be used with ChronoVA™/CA written below,
and allows you to take systematic variation effect in the transistor level
Monte Carlo simulation. It may be used in variation-aware Analog design
verification.
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ChronoVA™ Family