ChronoVA™ Family
Statistical Timing Analysis

Cell-Based Critical Path Analysis
ChronoVA™/PA


Although ChronoVA™/CA is very powerful to simulate the impact of variation, for a large scale circuit like a whole critical path consisting of tens of stages of standard cells, the speed advantage is impaired because the number of parameters fluctuation becomes too large and ends up with large number of iterations. If the design is hierarchically done and the SAP model of the lower hierarchy is known, number of sampling points, or collocation points, can be reduced using the behavior of the lower level as the constraint. This technique is named as Hierarchical SAP (HSAP).

ChronoVA™/PA is Critical Path Analysis tool using HSAP technique, and allows you to simulate the critical paths at the transistor level like Monte Carlo simulation.

ChronoVA™/PA reads a path list generated by the traditional STA tool, and apply SPICE simulation. Overall performance and accuracy are demonstrated in comparison with equivalent Monte Carlo simulation with 20 thousand iterations, resulting 100 times faster while less than 1% error at mean ±3σ.

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Statistical design solutions -
Product Line-Up
ChronoVA™ Family
   ChronoVA™/LC
   ChronoVA™/LVA
   ChronoVA™/SSTA
   ChronoVA™/CA
      ChronoVA™/PA
ChipScope™ Family
      ChipScope™/VC