Service

Measurement Data Calibration

Anova Solutions is providing data analysis service to extract the critical process, device and interconnect parameters which then can be used to our characterization and analysis software.

Typical service program includes:

• Test chip data analysis
  • Transistor measurement (Ids, Vth)
  • Ring Oscillator delay measurement
  • Poly CD (gate length) measurement
• Data analysis target
  • Transistor device variation, Critical parameters
  • Delay variation, systematic & Random
  • CD variation, systematic & Random
  • Correlations

Library Characterization

Anova Solutions is providing library characterization service to generate library which can be used in our ChronoVA™ statistical timing analysis environment.

Typical service program includes:

• Variation library (sample) characterization
  • Parameters based on data analysis result
  • On-chip-variation with systematic constrain
• Design Critical path trial
  • SSTA environment set-up
  • SSTA timing report

Contact Us

Call us for more information or quotation.

United States

Anova Solutions, Inc.
Tel: +1-408-980-8998
Fax: +1-408-980-8999

Japan

Sales and Marketing Division, Anova Solutions Corp.
Tel: +81-45-349-5703
Fax: +81-45-349-5704

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